|  We
use the Philips XL30 ESEM-FEG (Environmental Scanning Electron
Microscope Field Emission Gun).
The instrument was a breakthrough device
for high-resolution secondary imaging of specimens in a controlled
environment. It has the unique capabilities to examine specimens
at exceptionally high chamber pressures (up to 10 Torr).
Water containing samples can be viewed without
drying out since the gas pressure range in the specimen chamber
can exceed the saturated water vapor pressure,. This allows
us to look at “true” surface conditions rather
than after effects caused by vacuum deformation or drying.
Additionally, we can match accelerating voltages
to give us desired edge and penetration effects at very high
resolution in the total absence of specimen charging.
While the Field Emission Gun gives us exceptional
SEM resolution to 300,000X, the ESEM capability allows us
to examine samples without preparation.
Our instrument gives us the capability to…
- Analyze specimens in up to 10 Torr chamber pressure
- Analyze samples in their original state and then return
them to you.
- Analyze non-conductive materials in ESEM mode
- Analyze “unfriendly” samples (oily, dirty,
those that outgas)
- Analyze porous materials
- Analyze hydrated materials in a fully stable state
- Observe phase transitions
- Avoid coating interference
- Obtain high resolution edge and penetration effects
- Provide high resolution magnification to 300,000X in
SEM mode
- Give you access to results via video file and WEB ACCESS
(since the operating system is Windows NT based)
Typical materials for ESEM
analysis
- Biological specimens
- Paper
- Wool
- Fibers
- Plastics
- Ceramics
Dynamic processes can be examined
using ESEM
- Phase transitions (melting, freezing, crystallization)
- Out-gassing effects
- Absorption effects
- Vapor deposition or other layering effects.
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